2012 |
Parallel fluid modeling of a dome- shape inductively coupled plasma reactor with fluorocarbon precusor |
吳宗信,Y.-M. Chiu, C.-T. Hung and J.-S. Wu* |
39th IEEE International Conference on Plasma Science (ICOPS2012) |
Edinburgh, Scotland, UK |
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2012 |
Development of a parallel fluid modeling code considering em wave effect |
吳宗信,C.-T. Hung, K.-M. Lin and J.-S. Wu* |
39th IEEE International Conference on Plasma Science (ICOPS2012) |
Edinburgh, Scotland, UK |
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2012 |
High Rotation Number Effect on Heat Transfer in a Leading Edge Cooling Channel with Three Channel Orientations |
劉耀先,Huang, S.C. and Liu, Y.H. |
ASME Turbo EXPO, GT-2012-68389 |
Copenhagen, Denmark |
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2012 |
(COMPEL 2012) The Novel V-groove TO-3P Packaging Design and Electrical Test of AlGaN/GaN Power HEMT
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鄭泗東(2023年退休),Chia-Hung Liu, Stone Cheng, Chi-Ying Li, and Po-Chien Chou
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京都 |
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2012 |
(COMPEL 2012) A New High Power Device of GaN HEMTs on Si Substrate with Lateral Heat Dissipation Packaging |
鄭泗東(2023年退休)/Stone Cheng |
COMPEL 2012 |
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2012 |
Investigation of Substrate Rotation on the Flow Field in a Chemical Vapor Deposition Chamber Using Particle Image Velocimetry |
劉耀先,Tseng, L.W., Wang, C.S., Liu, Y.H., Wang, C.C., Huang, C.Y., Chen, C.C., Lin, K.L. |
24th International Cryogenic Engineering Conference |
Fukuoka, Japan |
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2012 |
複合材料修補件之疲勞行為研究 |
金大仁(2020年退休),吳家宏,金大仁 |
中華民國第五屆破壞科學研討會論文集,pp.97-104. |
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2012 |
Two-Dimensional Pheromone Propagation Controller |
李安謙/Der-Shui Lee and An-Chen Lee |
International Conference on Mechanical, Industrial, and Manufacturing Technologies-MIMT 2012 |
Shenzhen, China |
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2012 |
Run-to-Run Mixed Product Overlay Process Control: Using Tool Based Disturbance Estimator (TBDE) Approach |
李安謙,An-Chen Lee, Tzu-Wei Kuo and Shang-Wei Chiang |
International Conference on Mechanical, Industrial, and Manufacturing Technologies-MIMT 2012 |
Shenzhen, China |
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2012 |
Fabrication of Deep Lateral Single-Crystal-Silicon Blaze Micro-grating by Inductively-Coupled-Plasma Reactive Ion Etch, |
徐文祥,Lin, Y. H., Weng, C. J., Su, C. Y. Su, Hsu, W. |
IEEE-NEMS 2012 |
Kyoto, Japan |
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