Year | 2011 |
---|---|
Authors | An-Chen Lee ,Wei Chin-Chung, Horng Jeng-Haur, Lee An-Chen, and Lin Jen-Fin |
Paper Title | Analyses and Experimental Confirmation of Removal Performance of Silicon Oxide Film in the Chemical Mechanical Polishing (CMP) Process with Pattern Geometry of Concentric Groove Pads |
Vol.No | 270 |
Page(s) | 172-180 |
Level Type | SCI |
Date of Publication | 2011-01-01 |
Language | English |
Reference URL | http://www.sciencedirect.com/science/article/pii/S0043164810003911 |