| Year | 2005 |
|---|---|
| Authors | Ray-Quan Hsu ,K. L. Ou,S.Y. Shiou,Ray-Quen Hsu |
| Paper Title | “Barrier capability of Hf-N Films with Various Nitrogen Concentrations Against Copper Diffusion in Cu/Hf-N/n + -p Junction Diodes ” |
| Journal Title | Journal of The Electrochemical Society |
| Vol.No | Vol.152(2) |
| Page(s) | 1-6 |
| Language | Chinese |
NYCU ME