NYCU ME| Year | 2016 |
|---|---|
| Authors | Wen-Syang Hsu ,Shieh, Y.-C., Lin, H.-Y., Hsu, W., and Lin, Y.-H. |
| Paper Title | A rapid fatigue test method on micro structures for high cycle fatigue |
| Journal Title | IEEE Transactions on Device and Materials Reliability |
| Vol.No | 16 |
| Page(s) | 61-68 |
| Language | English |
Login NYCU ME
