Year | 2010 |
---|---|
Authors | Tzong-Shi Liu ,Pan, S. P. and Liu, Tzong-Shi |
Paper Title | Precision Measurement of Sub 50 nm Linewidth by Stitching Double-tilt Images |
Journal Title | Japanese Journal of Applied Physics |
Vol.No | Vol. 49 |
Issue.No | No.6 |
Language | English |