Year | 2005 |
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Authors | Ray-Quan Hsu ,Keng-Liang Ou, Ray-Quan Hsu |
Paper Title | “Comparative study of polycrystalline Ti, amorphous Ti and multi-amorphous Ti as a barrier film for Cu interconnect” |
Journal Title | Journal of Vacuum Science and Technology B(accepted) |
Vol.No | vol.30 |
Page(s) | 229-235 |
Language | Chinese |