| Year | 2009 | 
|---|---|
| Project Category | Research Projects | 
| Project Title | Semiconductor lithography coverage error of advanced process batch control research and development (2/2) | 
| Participator | An-Chen Lee | 
| Job Title | Principle investigator | 
| Period | 2009.08 ~ 2010.10 | 
| Unit | National Science Council | 
| Note | {"en"=>nil, "zh_tw"=>nil} | 
| Language | Chinese | 
 
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