Year | 2006 |
---|---|
Authors | Tai-Yan Kam ,Zhang Yaowen, Tai-Yan Kam |
Paper Title | Different failure criteria of fatigue life reliability of the IC card read head |
Conference Name | The twenty-third National Conference |
Peroid | Apr. 11, 2012 ~ Up to today |
Sponsor | Chinese Mechanical Engineering Society |
Language | English |