| Year | 2006 |
|---|---|
| Authors | Tai-Yan Kam ,Zhang Yaowen, Tai-Yan Kam |
| Paper Title | Different failure criteria of fatigue life reliability of the IC card read head |
| Conference Name | The twenty-third National Conference |
| Peroid | Apr. 11, 2012 ~ Up to today |
| Sponsor | Chinese Mechanical Engineering Society |
| Language | English |
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