Year | 1995 |
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Authors | Tai-Yan Kam /T.Y. Kam and T.Y. Lee |
Paper Title | “Reliability Analysis of Degraded Structures using a Statistical System Identification Technique” |
Conference Name | Applications of Statistics and Probability, 7th Int’l conf. Reliability and Risk Analysis, Favre & Mebarki(eds),Vol.2.pp.963-969 |